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Universal System

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Flying Probe System

A5

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A7 Pro

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S2-08

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ECT PIN

Flying Probe System
HOME> Sales > A7
atg LM is launching an entirely new flying prober generation. The double-sided test system A7 has 8 test probes and 4 high resolution XGA color cameras for the optical scanning of PCBs. Using modern linear drives, the A7 achieves a test speed which was unimaginable 5 years ago. The acceleration of the probes now has increased from 8 g to 20 g (20 times acceleration of gravity). Despite high deceleration forces, the extremely torsion resistant and light carbon fiber axes allow precise positioning. Minimal test structures of 35 μm can be contacted. The system can be equipped with various test probes. Their contacting force can be adjusted to 0.2 g. The A7 offers a variety of test options.
Apart from the test of flexible boards, the A7 focuses on the test of embedded components. Besides, passive components such as resistors, coils, capacities, diodes and varistors can be tested. The wiring test of active ICs within the PCB is possible also.





Max. board size (X x Y) 640 mm x 610 mm / 25.2" x 24.0"
Min. board size (X x Y) 10 mm x 10 mm / 0.4" x 0.4"
Test area (X x Y) 610 mm x 510 mm / 24.0" x 20.0"
Board thickness up to 10 mm / 0.4"
Smallest pad 35 μm / 1.4 mil*
50 μm / 2.0 mil
Smallest pitch 100 μm / 4.0 mil
Resolution measurement
system
± 1 μm / ± 0.04 mil
Repeatable accuracy ± 4 μm / ± 0.16 mil
Soft touch probes or 5 g to 15 g
*Micro needle probes 0.2 g to 2.5 g

Continuity test 1 Ω to 10 kΩ
Isolation test up to 25 MΩ (FM)
up to 10 GΩ (ohmic)
MicroShort Detection®
Test voltage up to 500

4 color cameras (1024 x 768 pixels) for fast optical scanning of top and bottom side

4-wire measurement with max. 300 mA test current
0.25 mΩ to 1 kΩ up to 500
with Kelvin probes up to 500
Smallest pad up to 500
Smallest pitch up to 500
*with Kelvin probe fine adjustment

Embedded components test
R 0.5 Ω to 10 MΩ ± 0.5 %, min ± 0.5 Ω
>10 MΩ to 50 MΩ ± 2 %
C 0.1 pF to 100 μF ± 2 %, min ± 0.03 pF
L 0.2 μH to 5 mH ± 3 %, min ± 0.1 μH
Diode / Varistor UR reverse voltage and
UBR breakdown voltage up to 10 V
LaTest® open detection
with LaTest® probes
1 g to 10 g
High current 1.4 A (1 kHz)
Test voltage up to 1000 V
Pneumatic clamping for flexible boards
Retest of fault files from external grid test systems on inquiry
Repair software with barcode support

Required Utility
Data Input Format IPC-D-356A
Network Connection Ethernet, TCP / IP
Power Supply 3 x 400 V, 50 Hz (3 x 208 V, 60 Hz), 1000 VA
Compressed Air 6 bar / 90 psi, filtered
Temperature 18 °C to 27 °C / 66 °F to 81 °F, ± 3 K
Relative Humidity 40 % to 60 %
Machine Weight 900 kg / 1984 lb
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headquartered 908-10hogye-dong,dongan-gu, anyang-si,gyeonggi-do,korea TEL 031.456.6171 FAX 031.456.6613 COPYRIGHT 2013 LM DIGLTAL COMPANY ALL RIGHTS RESERVED
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